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Livres
Articles (45)
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The single-event effect evaluation technology for nano integrated circuits

Zheng, Hongchao, Zhao, Yuanfu, Yue, Suge, Fan, Long, Du, Shougang, Chen, Maoxin, Yu, Chunqing

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 531 KB

english, 2015

Modeling and simulation of single-event effect in CMOS circuit

Yue, Suge, Zhang, Xiaolin, Zhao, Yuanfu, Liu, Lin, Wang, Hanning

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 3.45 MB

english, 2015

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - A low-voltage CMOS low-dropout regulator with novel capacitor-multiplier frequency compensation

Zushu Yan,, Liangguo Shen,, Yuanfu Zhao,, Suge Yue,

Année:

2008

Langue:

english

Fichier:

PDF, 340 KB

english, 2008

[IEEE 2006 IEEE North-East Workshop on Circuits and Systems - Gatineau, QC, Canada (2006.6.18-2006.6.18)] 2006 IEEE North-East Workshop on Circuits and Systems - Frequency Compensation for Multistage Amplifiers Using Active-Feedback Current Buffers

Yan, Zushu, Bian, Qiang, Zhao, Yuanfu, Yue, Suge

Année:

2006

Langue:

english

Fichier:

PDF, 345 KB

english, 2006

[IEEE 2011 IEEE 9th International Conference on Dependable, Autonomic and Secure Computing (DASC) - Sydney, Australia (2011.12.12-2011.12.14)] 2011 IEEE Ninth International Conference on Dependable, Autonomic and Secure Computing - Analysis of the New Latchup Model for Deep Sub-micron Integrated Circuits

Dong, Pan, Fan, Long, Yue, Suge, Zheng, Hongchao, Du, Shougang

Année:

2011

Langue:

english

Fichier:

PDF, 511 KB

english, 2011

[IEEE 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Nanjing (2017.11.8-2017.11.11)] 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Design of a novel 12T radiation hardened memory cell tolerant to single event upsets (SEU)

Hu, Chunyan, Yue, Suge, Lu, Shijin

Année:

2017

Langue:

english

Fichier:

PDF, 291 KB

english, 2017

[IEEE 2019 IEEE 3rd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - Chengdu, China (2019.3.15-2019.3.17)] 2019 IEEE 3rd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - A Low-Jitter 10GHz PLL Based on Adaptive Bandwidth Technique for Muti-Rate Serial Link Data Transmitter

Liu, Yajiao, Yue, Suge, Han, Xupeng, Liu, Jiaqi

Année:

2019

Langue:

english

Fichier:

PDF, 143 KB

english, 2019

Single Event Effect Characterization of High Speed Serial JESD204B Data Receiver

Li, Junze, Yue, Suge, Chen, Maoxin, Song, Xiaojing

Journal:

Journal of Physics Conference Series

Année:

2019

Fichier:

PDF, 778 KB

2019

[IEEE 2020 IEEE 3rd International Conference on Electronics Technology (ICET) - Chengdu, China (2020.5.8-2020.5.12)] 2020 IEEE 3rd International Conference on Electronics Technology (ICET) - Research on Pulsed Laser Induced Single Event Effect for High-Speed Serial Interface

Li, Junze, Yue, Suge, Chen, Maoxin, Song, Xiaojing

Année:

2020

Fichier:

PDF, 7.09 MB

2020

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits

Limbrick, Daniel B., Yue, Suge, Robinson, William H., Bhuva, Bharat L.

Année:

2011

Langue:

english

Fichier:

PDF, 345 KB

english, 2011

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - Capacitor-Multiplier Frequency Compensation for Low-Power Multistage Amplifiers

Yan, Zushu, Shen, Liangguo, Zhao, Yuanfu, Yue, Suge

Année:

2007

Langue:

english

Fichier:

PDF, 419 KB

english, 2007

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - An Efficient Design of Single Event Transients Tolerance for Logic Circuits

Mo, Yantu, Yue, Suge

Année:

2008

Langue:

english

Fichier:

PDF, 443 KB

english, 2008

Frequency Effect on SEU of D Flip-Flop

Dong, Pan, Fan, Long, Zheng, Hong Chao, Yue, Suge

Journal:

Applied Mechanics and Materials

Année:

2011

Langue:

english

Fichier:

PDF, 680 KB

english, 2011

[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - An SEU-Tolerant Programmable Frequency Divider

Wang, Liang, Yue, Suge, Zhao, Yuanfu, Fan, Long

Année:

2007

Langue:

english

Fichier:

PDF, 258 KB

english, 2007

[IEEE 2007 International Conference on Microwave and Millimeter Wave Technology - Guilin, China (2007.04.18-2007.04.21)] 2007 International Conference on Microwave and Millimeter Wave Technology - Low-Overhead SEU-Tolerant Latches

Wang, Liang, Yue, Suge, Zhao, Yuanfu

Année:

2007

Langue:

english

Fichier:

PDF, 2.13 MB

english, 2007

[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - 3D simulation of charge collection and SEU of 0.13µm partially depleted SOI SRAM

Zhang, Xiaochen, Yue, Suge, Wang, Liang, Li, Jiancheng

Année:

2010

Langue:

english

Fichier:

PDF, 472 KB

english, 2010

[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - New latch-up model for deep sub-micron integrated circuit

Don, Pan, Fan, Long, Yue, Suge, Zheng, Hongchao, Du, Shougang

Année:

2011

Langue:

english

Fichier:

PDF, 172 KB

english, 2011

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Single event effects on hard-by-design latches

Liang Wang,, Yuhong Li,, Suge Yue,, Yuanfu Zhao,, Long Fan,, Liquan Liu,

Année:

2007

Langue:

english

Fichier:

PDF, 2.31 MB

english, 2007

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - A Monte Carlo-based control signal generator for single event effetc (SEE) fault injection

Zheng, Hongchao, Fan, Long, Yue, Suge, Liu, Liquan

Année:

2009

Langue:

english

Fichier:

PDF, 402 KB

english, 2009

[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - ESD device simulation in a pre-Si phase

Zhiguo Li,, Suge Yue,

Année:

2008

Langue:

english

Fichier:

PDF, 403 KB

english, 2008

[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - 3D Simulation of transient current and charge collection induced by heavy ion in SOI transistors

Zhang, Xiaochen, Yue, Suge, Wang, Liang

Année:

2010

Langue:

english

Fichier:

PDF, 311 KB

english, 2010

[IEEE 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications (ISPA) - Sydney, Australia (2008.12.10-2008.12.12)] 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications - FITVS: A FPGA-Based Emulation Tool For High-Efficiency Hardness Evaluation

Zheng, Hongchao, Fan, Long, Yue, Suge

Année:

2008

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2008

[IEEE Electronics (PrimeAsia) - Shanghai, China (2009.01.19-2009.01.21)] 2009 Asia Pacific Conference on Postgraduate Research in Microelectronics & Electronics (PrimeAsia) - GDNMOS design for ESD protection in submicron CMOS VLSI

Li, Zhiguo, Suge, Yue, Yongshu, Sun

Année:

2009

Langue:

english

Fichier:

PDF, 1.37 MB

english, 2009

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Single event transients of scan flip-flop and an SET-immune redundant delay filter (RDF)

Zhao, Xinyuan, Wang, Liang, Yue, Suge

Année:

2013

Langue:

english

Fichier:

PDF, 1.21 MB

english, 2013

[IEEE 2011 IEEE 9th International Conference on Dependable, Autonomic and Secure Computing (DASC) - Sydney, Australia (2011.12.12-2011.12.14)] 2011 IEEE Ninth International Conference on Dependable, Autonomic and Secure Computing - New Latch-Up Model for Deep Sub-micron Integrated Circuits

Dong, Pan, Fan, Long, Yue, Suge, Zheng, Hongchao, Du, Shougang

Année:

2011

Langue:

english

Fichier:

PDF, 453 KB

english, 2011

[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Power rail ESD circuit simulation and verification

Li Zhiguo,, Yue Suge,, Sun Yongshu,

Année:

2009

Langue:

english

Fichier:

PDF, 4.55 MB

english, 2009

[IEEE 2009 Fifth International Joint Conference on INC, IMS and IDC - Seoul, South Korea (2009.08.25-2009.08.27)] 2009 Fifth International Joint Conference on INC, IMS and IDC - 3D Simulation of Charge Collection and MNU in Highly-Scaled SRAM Design

Lin, Liu, Yuanfu, Zhao, Suge, Yue

Année:

2009

Langue:

english

Fichier:

PDF, 453 KB

english, 2009

[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Impact of gate shapes on single event transients

Zhao Xinyuan,, Wang liang,, Yue Suge,

Année:

2014

Langue:

english

Fichier:

PDF, 428 KB

english, 2014

SEU and SET of 65 Bulk CMOS Flip-flops and Their Implications for RHBD

Zhao, Yuanfu, Wang, Liang, Yue, Suge, Wang, Dan, Zhao, Xinyuan, Sun, Yongshu, Li, Dongqiang, Wang, Fuqing, Yang, Xiaoqian, Zheng, Hongchao, Ma, Jianhua, Fan, Long

Journal:

IEEE Transactions on Nuclear Science

Année:

2015

Langue:

english

Fichier:

PDF, 821 KB

english, 2015

[IEEE 2010 Second International Conference on Communication Systems, Networks and Applications (ICCSNA) - Hong Kong, China (2010.06.29-2010.07.1)] 2010 Second International Conference on Communication Systems, Networks and Applications - Highly-scaled SRAM immunity to MNU based on analysis of an induced parasitic bipolar effect

Lin Liu,, Yuanfu Zhao,, Suge Yue,, Jiancheng Li,, Shijing Lu,, Yantu Mo,, Longjie Su,, Xiaocheng Zhang,

Année:

2010

Langue:

english

Fichier:

PDF, 908 KB

english, 2010

[IEEE 2015 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2015.3.15-2015.3.16)] 2015 China Semiconductor Technology International Conference - A wide input voltage range, output-capacitorless linear voltage regulator in 0.25UM BCD process

Danhui Wang,, Yuanfu Zhao,, Suge Yue,

Année:

2015

Langue:

english

Fichier:

PDF, 1.68 MB

english, 2015

[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - A 0.996mW 10GHz slicer with 20mV input resolution in 65nm CMOS

Chen, Yanan, Yue, Suge, Bian, Qiang, Shi, Fei

Année:

2016

Langue:

english

Fichier:

PDF, 290 KB

english, 2016

Single event soft error in advanced integrated circuit

Zhao, Yuanfu, Yue, Suge, Zhao, Xinyuan, Lu, Shijin, Bian, Qiang, Wang, Liang, Sun, Yongshu

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 1.34 MB

english, 2015

The investigation on sensitive mapping of memory cell in microprocessor

Yu, Chunqing, Fan, Long, Yue, Suge, Chen, Maoxin, Du, Shougang, Zheng, Hongchao

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 2.93 MB

english, 2015

A prediction technique for single-event effects on complex integrated circuits

Zhao, Yuanfu, Yu, Chunqing, Fan, Long, Yue, Suge, Chen, Maoxin, Du, Shougang, Zheng, Hongchao

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 376 KB

english, 2015

Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architecture

Zhao, Yuanfu, Zheng, Hongchao, Fan, Long, Yue, Suge, Chen, Maoxin, Du, Shougang

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 2.58 MB

english, 2015

A four-interleaving HBD SRAM cell based on dual DICE for multiple node collection mitigation

Liu, Lin, Yue, Suge, Lu, Shijin

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2015

[IEEE 2016 International Conference on Control, Decision and Information Technologies (CoDIT) - Saint Julian's, Malta (2016.4.6-2016.4.8)] 2016 International Conference on Control, Decision and Information Technologies (CoDIT) - A 8.0Gb/s source-series-terminated transmitter driver with 3 tap FFE for multi-standard applications in 65 nm CMOS

Chen, Yanan, Yue, Suge, Bian, Qiang, Shi, Fei

Année:

2016

Langue:

english

Fichier:

PDF, 339 KB

english, 2016

Predictions for proton and heavy ions induced SEUs in 65 nm SRAMs

Du, Shougang, Yue, Suge, Liu, Hongxia, Fan, Long, Zheng, Hongchao

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 259 KB

english, 2015

Single event transient pulse width measurement of 65-nm bulk CMOS circuits

Yue, Suge, Zhang, Xiaolin, Zhao, Xinyuan

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 447 KB

english, 2015

Analysis and RHBD technique of single event transients in PLLs

Han, Zhiwei, Wang, Liang, Yue, Suge, Han, Bing, Du, Shougang

Journal:

Journal of Semiconductors

Année:

2015

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2015

Evaluation of SEE on a 32-bit Microprocessor by Laser Test and Heavy Ion Test

Yu, Chun Qing, Fan, Long, Yue, Suge, Ma, Jian Hua, Zheng, Hong Chao

Journal:

Advanced Materials Research

Année:

2015

Langue:

english

Fichier:

PDF, 1.66 MB

english, 2015

Total Ionizing Dose Influence on the Single Event Multiple-Cell Upsets in 65nm 6-T SRAM

Zheng, Qiwen, Cui, Jiangwei, Lu, Wu, Guo, Hongxia, Liu, Jie, Yu, Xuefeng, Wang, Liang, Liu, Jiaqi, He, Chengfa, Ren, Diyuan, Yue, Suge, Zhao, Yuanfu, Guo, Qi

Journal:

IEEE Transactions on Nuclear Science

Année:

2018

Langue:

english

Fichier:

PDF, 542 KB

english, 2018

A Fast-Lock Low-Jitter PLL Based Adaptive Bandwidth Technique

Liu, Yajiao, Yue, Suge, Han, Xupeng, Liu, Jiaqi

Journal:

Journal of Physics Conference Series

Année:

2018

Langue:

english

Fichier:

PDF, 654 KB

english, 2018

[IEEE 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Geneva, Switzerland (2017.10.2-2017.10.6)] 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Single-Event Transient Analysis and Hardening in a 180 nm CMOS Embedded Low-Dropout Regulator

Wang, Liang, Han, Xupeng, Zhao, Yuanfu, Bian, Qiang, Yue, Suge, Lu, Shijin, Shu, Lei, Liu, Jiaqi, Li, Tongde

Année:

2017

Langue:

english

Fichier:

PDF, 464 KB

english, 2017